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Computer Graphics & Delay Fault Test Pattern Generator Using Indirect Implication Algorithms in Scan Environment
Kim Won Gi, Kim Myoung Gyun, Kang Sung Ho The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 6, No. 6, pp. 1656-1666,
Jun.
1999
10.3745/KIPSTE.1999.6.6.1656
10.3745/KIPSTE.1999.6.6.1656
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Vol. 13, 2024
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Vol. 12, 2023
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Vol. 1, 2012
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All publications of KTSDE is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTSDE is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
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